Applied Scanning Probe Methods V: Scanning Probe Microscopy by Sadik Hafizovic, Kay-Uwe Kirstein, Andreas Hierlemann

By Sadik Hafizovic, Kay-Uwe Kirstein, Andreas Hierlemann (auth.), Professor Bharat Bhushan, Satoshi Kawata, Professor Dr. Harald Fuchs (eds.)

The scanning probe microscopy ?eld has been quickly increasing. it's a not easy activity to assemble a well timed review of this ?eld with an emphasis on technical dev- opments and business purposes. It grew to become obvious whereas enhancing Vols. I–IV that a huge variety of technical and applicational elements are current and speedily - veloping around the world. contemplating the luck of Vols. I–IV and the truth that extra colleagues from best laboratories have been able to give a contribution their most recent achie- ments, we made up our minds to extend the sequence with articles touching ?elds now not lined within the past volumes. The reaction and help of our colleagues have been very good, making it attainable to edit one other 3 volumes of the sequence. not like to- cal convention complaints, the utilized scanning probe equipment intend to offer an summary of modern advancements as a compendium for either functional functions and up to date easy examine effects, and novel technical advancements with admire to instrumentation and probes. the current volumes conceal 3 major components: novel probes and strategies (Vol. V), charactarization (Vol. VI), and biomimetics and business functions (Vol. VII). quantity V contains an outline of probe and sensor applied sciences together with built-in cantilever recommendations, electrostatic microscanners, low-noise tools and more advantageous dynamic strength microscopy thoughts, high-resonance dynamic strength - croscopy and the torsional resonance approach, modelling of tip cantilever structures, scanning probe tools, ways for elasticity and adhesion measurements at the nanometer scale in addition to optical functions of scanning probe ideas in accordance with near?eld Raman spectroscopy and imaging.

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An unwanted side-effect of heating the cantilever is the sensor-actuator crosstalk (SAC), a thermally-induced signal in the Wheatstone bridge. The underlying phenomenon is the thermal stress generated in the Wheatstone bridge. , the constant-force mode at low contact force. 7) The SAC can be compensated for in an integrated AFM system as will be described in Sect. 4. It has to be noted that systems relying on piezoelectric actuation and piezoresistive readout also suffer from SAC. The respective cantilevers feature a stiffer actuator region close to the cantilever base and a softer sensing section [3, 30].

King . . . . . . . . . . 251 Subject Index . . . . . . . . . . . . . . . . . . . . . . . . . . jp Bharat Bhushan Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W 390 Scott Laboratory, 201 W. edu Daniel Ebeling Center for NanoTechnology (CeNTech), Heisenbergstr. ch Hendrik Hölscher Center for NanoTechnology (CeNTech), Heisenbergstr. edu Tilman E. Schäffer Institute of Physics and Center for Nanotechnology, University of Münster Heisenbergstr.

The production spread makes additional calibration measures necessary, as large offsets would saturate the readout electronics or would limit the maximum signal gain and, therefore, the transducer resolution. Several silicon-based cantilevers with single integrated piezoresistive force sensors have been realized by local diffusion of p-type silicon in an n-type substrate or vice versa [22–26]. The use of advanced fabrication technologies like CMOS enables the realization of more complex structures using metal lines as interconnects.

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